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INFLUENCE OF REFLECTION OF PHOTOELECTRONS FROM THE SURFACE PHOTO-EMF IN THIN SEMICONDUCTOR FILMS AND COMPARE IT WITH THE BULK PHOTO-EMF

https://doi.org/10.15518/isjaee.2015.21.002

Abstract

The influence of the reflection of photoelectrons from the surface photo-EMF in thin semiconductor films and compare it with the bulk photo-EMF. It is shown that the reflected photovoltage can prevail over the bulk of the electromotive force only in samples with a large mean free path with a strong absorption of light. In thin films reflected the photo-EMF, apparently observed with other types of photo-EMF and the interpretation of the experimental results can be interpreted as the volume electromotive force.

About the Authors

G. Gulyams
Namangan Engineering-Pedagogical Institute 12 Dustlik ave., Namangan, 160103, Republic of Uzbekistan
Uzbekistan

doctor of Physical and Mathematical Sciences, Professor of “Physics”



M. G. Dadamirzayev
Namangan Engineering-Pedagogical Institute 12 Dustlik ave., Namangan, 160103, Republic of Uzbekistan
Uzbekistan

Ph.D. in Physical and Mathematical Sciences, Head of the Department “Physics”



N. Yu. Sharibaev
Namangan Engineering-Technological Institute 7 Kasanay str., Namangan, 160115, Republic of Uzbekistan
Uzbekistan

Ph.D. in Physical and Mathematical Sciences, Associate Professor of the Department of “Higher Mathematics”



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Review

For citations:


Gulyams G., Dadamirzayev M.G., Sharibaev N.Yu. INFLUENCE OF REFLECTION OF PHOTOELECTRONS FROM THE SURFACE PHOTO-EMF IN THIN SEMICONDUCTOR FILMS AND COMPARE IT WITH THE BULK PHOTO-EMF. Alternative Energy and Ecology (ISJAEE). 2015;(21):20-23. (In Russ.) https://doi.org/10.15518/isjaee.2015.21.002

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ISSN 1608-8298 (Print)